Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.20543/mkkp.v36i2.6140
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | Full PDF (569.05 KB) | DOI: 10.30595/jppm.v5i1.8592
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.31284/j.jpp-iptek.2019.v3i1.488
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.31284/j.jpp-iptek.2018.v2i2.283
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | Full PDF (714.622 KB) | DOI: 10.33366/rekabuana.v4i1.1023
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | Full PDF (604.068 KB) | DOI: 10.31284/j.jmesi.2022.v2i1.2993
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.22322/dkb.v39i1.6941