Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | Full PDF (169.445 KB) | DOI: 10.31284/j.iptek.2019.v23i1.425
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | Full PDF (252.247 KB)
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | Full PDF (3424.509 KB) | DOI: 10.22219/JTIUMM.Vol12.No2.156-161
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | Full PDF (261.074 KB) | DOI: 10.12962/j23373539.v5i2.18546
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | Full PDF (1115.087 KB) | DOI: 10.12962/j23373539.v6i1.21423
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | Full PDF (769.12 KB) | DOI: 10.12962/j23373539.v5i2.18751
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | Full PDF (1092.038 KB) | DOI: 10.12962/j23373539.v2i1.2225
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | Full PDF (530.796 KB) | DOI: 10.12962/j23373539.v2i1.2199
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | Full PDF (281.449 KB) | DOI: 10.12962/j23373539.v1i1.840