Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | Full PDF (610.041 KB)
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | Full PDF (502.824 KB) | DOI: 10.32528/ipteks.v1i1.260
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | Full PDF (252.783 KB) | DOI: 10.32528/pengabdian_iptek.v3i2.1477
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | Full PDF (235.703 KB) | DOI: 10.32528/pengabdian_iptek.v1i1.177
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | Full PDF (381.484 KB) | DOI: 10.32528/justindo.v1i01.240
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | Full PDF (310.186 KB) | DOI: 10.32528/justindo.v2i1.1043
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | Full PDF (270.252 KB) | DOI: 10.32528/justindo.v2i2.1044
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.26740/jp.v5n2.p30-35
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.33258/birex.v2i4.1265
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar