Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | Full PDF (270.847 KB) | DOI: 10.32524/saintek.v2i1.416
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | Full PDF (460.743 KB) | DOI: 10.32524/saintek.v2i2.468
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | Full PDF (565.936 KB) | DOI: 10.32524/saintek.v3i1.539
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | Full PDF (270.847 KB) | DOI: 10.32524/saintek.v2i1.416
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | Full PDF (460.743 KB) | DOI: 10.32524/saintek.v2i2.468
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.47233/jteksis.v3i1.219
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | Full PDF (247.16 KB) | DOI: 10.36275/stsp.v17i2.73
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | Full PDF (404.781 KB) | DOI: 10.36275/stsp.v16i1.55
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | Full PDF (323.528 KB) | DOI: 10.36275/stsp.v16i2.47
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.31869/mi.v15i1.2755