International Journal Engineering and Applied Technology (IJEAT)
Vol. 2 No. 2 (2019): International Journal of Engineering and Applied Technology (IJEAT)

COMPARISON C4.5 AND NAÏVE BAYES METHODS BASED ON PARTICLE SWARM OPTIMIZATION IN LEVELS OF DROP OUT STUDENTS

dudih gustian (Nusa Putra University)
Faridatun Ni’mah (Universitas Nusa Putra)
Agus Darmawan (Universitas Nusa Putra)

Article Info

Publish Date
26 Nov 2019

Abstract

The high percentage of drop-out students causes a campus management problem, this is because the percentage of students graduating on time is one of the elements of accreditation assessment set by the national accreditation board of higher education. One reason why the drop out rate is still high is because the Management System has not run well, such as lecturer professionalism, campus facilities, academics and administration, student affairs, outside influence and student personality. This study aims to analyze several indicators that can cause student drop outs by comparing the C4.5 method based on particle swarm optimization and Naïve Bayes based on PSO. This study contributes to campus management in anticipating the occurrence of drop outs through indicators that occur and can predict student drop out rates through the classification process. The highest level of accuracy produced from C4.5 + PSO is around 99.32% with AUC from Naïve Bayes is 0.974 categorized as excellent classification.

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Journal Info
International Journal Engineering and Applied Technology (IJEAT)
Website

Abbrev

IJEAT

Publisher

Universitas Nusa Putra

Subject

Civil Engineering, Building, Construction & Architecture Computer Science & IT Electrical & Electronics Engineering Engineering Mechanical Engineering

Description

IJEAT publishes original papers only and the submission of a manuscript will be taken to imply that the contributions are original and that no similar manuscript has been or is being submitted to other journals. Manuscripts are solicited from all areas of specialization in engineering. IJEAT is an ...