Pillar of Physics: Jurnal Berkala Ilmiah Fisika
Vol 15, No 2 (2022)

Scanning Electron Microscopy for Nanostructure Analysis of Hybrid Multilayer Coating

Debi Rianto (Department of Physics, Durham University, South Rd, Durham, DH1 3LE)

Article Info

Publish Date
31 Dec 2022

Abstract

Scanning Electron Microscope (SEM) has been used in various studies to retrieve detailed information on nanomaterial structure. This study is an effort to propose SEM as the proper tool to investigate the properties of Hybrid Multilayer Coating as our model. The analysis should include nanoparticle size and its distribution on the surface, the thickness of the layers, the chemical composition and the crystal grain size in the layers. Several methods in SEM are beneficial to characterize these features are topography image, compositional image, X-Ray Spectrometry and Electron Backscattered Diffraction pattern. This technique also has several limitations ranging from chemical sensitivity, resolution to sample preparation

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Journal Info
Pillar of Physics: Jurnal Berkala Ilmiah Fisika
Website

Abbrev

fis

Publisher

Universitas Negeri Padang

Subject

Earth & Planetary Sciences Materials Science & Nanotechnology Physics

Description

This journal publishes original articles on the latest issues and trends occurring internationally in: 1 Geophysics, 2 Electronics and Instrumentation, 3 Material Physics, (4) Computational Physics. Other topics are related to physics are most ...