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Kwang-Baek Kim
Silla University
Computer Science & IT Electrical & Electronics Engineering

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Journal : International Journal of Electrical and Computer Engineering

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Defect Detection in Ceramic Images Using Sigma Edge Information and Contour Tracking Method Kwang-Baek Kim; Young Woon Woo
International Journal of Electrical and Computer Engineering (IJECE) Vol 6, No 1: February 2016
Publisher : Institute of Advanced Engineering and Science

Show Abstract | Download Original | Original Source | Check in Google Scholar | Full PDF (1366.601 KB) | DOI: 10.11591/ijece.v6i1.pp160-166

Abstract

In this paper, we suggest a method of detecting defects by applying Hough transform and least squares on ceramic images obtained from non-destructive testing. In the ceramic images obtained from non-destructive testing, the background area, where the defect does not exist, commonly shows gradual change of luminosity in vertical direction. In order to extract the background area which is going to be used in the detection of defects, Hough transform is performed to rotate the ceramic image in a way that the direction of overall luminosity change lies in the vertical direction as much as possible. Least squares is then applied on the rotated image to approximate the contrast value of the background area. The extracted background area is used for extracting defects from the ceramic images. In this paper we applied this method on ceramic images acquired from non-destructive testing. It was confirmed that extracted background area could be effectively applied for searching the section where the defect exists and detecting the defect.
Co-Authors Young Woon Woo