International Journal of Electrical and Computer Engineering
Vol 6, No 1: February 2016

Defect Detection in Ceramic Images Using Sigma Edge Information and Contour Tracking Method

Kwang-Baek Kim (Silla University)
Young Woon Woo (Dong-Eui University)



Article Info

Publish Date
01 Feb 2016

Abstract

In this paper, we suggest a method of detecting defects by applying Hough transform and least squares on ceramic images obtained from non-destructive testing. In the ceramic images obtained from non-destructive testing, the background area, where the defect does not exist, commonly shows gradual change of luminosity in vertical direction. In order to extract the background area which is going to be used in the detection of defects, Hough transform is performed to rotate the ceramic image in a way that the direction of overall luminosity change lies in the vertical direction as much as possible. Least squares is then applied on the rotated image to approximate the contrast value of the background area. The extracted background area is used for extracting defects from the ceramic images. In this paper we applied this method on ceramic images acquired from non-destructive testing. It was confirmed that extracted background area could be effectively applied for searching the section where the defect exists and detecting the defect.

Copyrights © 2016






Journal Info

Abbrev

IJECE

Publisher

Subject

Computer Science & IT Electrical & Electronics Engineering

Description

International Journal of Electrical and Computer Engineering (IJECE, ISSN: 2088-8708, a SCOPUS indexed Journal, SNIP: 1.001; SJR: 0.296; CiteScore: 0.99; SJR & CiteScore Q2 on both of the Electrical & Electronics Engineering, and Computer Science) is the official publication of the Institute of ...