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All Journal JAREE (Journal on Advanced Research in Electrical Engineering)
Pablo Petrashin
Universidad Católica de Córdoba
Control & Systems Engineering Electrical & Electronics Engineering

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Embedded Radiation sensor with OBIST structure for applications in mixed signal systems Pablo Petrashin; Walter Lancioni; Agustín Laprovitta; Juan Castagnola
JAREE (Journal on Advanced Research in Electrical Engineering) Vol 5, No 2 (2021): October
Publisher : Department of Electrical Engineering ITS and FORTEI

Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.12962/jaree.v5i2.194

Abstract

Oscillation based testing (OBT) has proven to be a simple and effective test strategy for numerous kind of circuits. In this work, OBT is applied to a radiation sensor to be used as a VLSI cell in embedded applications, implementing an oscillation built-in self-test (OBIST) structure. The oscillation condition is achieved by means of a minimally intrusive switched feedback loop and the response evaluation circuit can be included in a very simple way, minimizing the hardware overhead. The fault simulation indicates a fault coverage of 100% for the circuit under test.Keywords: fault simulation, mixed signal testing, OBIST, oscillation-based test, VLSI testing.
Temperature compensated low voltage MOSFET radiation sensor: proof of concept and a case study Pablo Petrashin; Walter Lancioni; Luis Toledo; Agustin Laprovitta; Juan Castagnola
JAREE (Journal on Advanced Research in Electrical Engineering) Vol 4, No 2 (2020): October
Publisher : Department of Electrical Engineering ITS and FORTEI

Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.12962/j25796216.v4.i2.132

Abstract

This paper presents a proof of concept performed on a new and very simple CMOS circuit configuration that implements a radiation dosimeter based on the threshold voltage difference (VTH) principle. The circuit used does not use resistors and all the transistors work in strong inversion, their mobility factor being completely canceled by the proposed architecture. Its operation exploits the relationship between radiation and VTH shifting, which allows, through a circuit configuration, to compensate for temperature variation and amplify the reaction to radiation, making it ideal for integrated industrial applications due to its simplicity and good operation. The circuit was designed for operation in areas naturally at risk of radiation, for example nuclear power plants or radiological clinics. Its advantage over other circuits that perform similar functions is mainly its low cost and simplicity of design.Keywords: CMOS dosimeters, radiation dosimetry, temperature compensation.
Co-Authors Agustín Laprovitta Agustin Laprovitta Juan Castagnola Juan Castagnola Luis Toledo Walter Lancioni