International Journal of Electrical and Computer Engineering
Vol 5, No 4: August 2015

Handling Low and High Demand Mode on Safety Instrumented Function

Totok R. Biyanto (Institute Technology Sepuluh Nopember)
Franky Kusuma (Institute Technology Sepuluh Nopember)
Hendra Cordova (Institute Technology Sepuluh Nopember)
Yerry Sutatio (Institute Technology Sepuluh Nopember)
Ridho Bayuaji (Institute Technology Sepuluh Nopember)



Article Info

Publish Date
01 Aug 2015

Abstract

In this paper, demand rate and hazardous event frequency considerations which effect to the error on the SIL calculation will be discused. The various value of hazardous event frequency and demand rate will be evaluated in this paper. The  result of this paper is when hazardous event frequency 10E-06/year and PFD’s safeguard 0.00002, with test interval 1 year, the SILs of low and high demand start showing different level at demand 5.1/year. At that point, we shouldn’t use simplified formula for low demand, because it will make different SIL with the exponential formula and simplified high demand formula. The requared SIL targets are SIL 2 and SIL 1, for exponential formula and simplified high demand formula, respectifely. Hence, it should be taken more attention and consideration for various value of hazardous event frequency with various demand rate.

Copyrights © 2015






Journal Info

Abbrev

IJECE

Publisher

Subject

Computer Science & IT Electrical & Electronics Engineering

Description

International Journal of Electrical and Computer Engineering (IJECE, ISSN: 2088-8708, a SCOPUS indexed Journal, SNIP: 1.001; SJR: 0.296; CiteScore: 0.99; SJR & CiteScore Q2 on both of the Electrical & Electronics Engineering, and Computer Science) is the official publication of the Institute of ...