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Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.37253/se.v2i1.8689
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Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.55338/saintek.v4i3.995
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Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.24929/feb.v14i1.3294