Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.15294/jbat.v7i1.11415
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | Full PDF (706.077 KB) | DOI: 10.36456/abadimas.v4.i1.a2359
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.15294/jkomtek.v10i2.18031
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.37715/leecom.v2i1.1418
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.37715/leecom.v2i2.1593
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.15294/teknobuga.v9i1.26631
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.26858/jptp.v7i2.19027
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.36456/abadimas.v5.i02.a4268
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.25077/jtpa.25.1.54-58.2021
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.36456/abadimas.v4.i1.a2359