Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | Full PDF (933.548 KB) | DOI: 10.31284/j.iptek.2017.v21i2.203
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | Full PDF (725.878 KB)
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | Full PDF (523.617 KB) | DOI: 10.12962/j23546026.y2017i2.2272
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.12962/j23546026.y2020i6.11114
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | Full PDF (437.241 KB) | DOI: 10.12962/j23373539.v3i1.5546
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | Full PDF (568.88 KB) | DOI: 10.12962/j23373539.v4i2.9736
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | Full PDF (612.252 KB) | DOI: 10.12962/j23373539.v4i2.9808
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | Full PDF (622.852 KB) | DOI: 10.12962/j23373539.v4i2.9868
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.12962/j23373539.v7i1.28823
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | Full PDF (617.618 KB) | DOI: 10.12962/j23373539.v7i1.28915