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Show Abstract | Download Original | Original Source | Check in Google Scholar | Full PDF (534.564 KB) | DOI: 10.32528/ipteks.v2i1.559
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Show Abstract | Download Original | Original Source | Check in Google Scholar | Full PDF (952.296 KB) | DOI: 10.32528/pengabdian_iptek.v1i1.176
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Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.32528/hgn.v4i1.3484
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Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.32528/hgn.v3i2.2911
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Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.32528/hgn.v3i2.2917
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Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.32528/hgn.v5i1.3589
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Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.32528/hgn.v4i1.3483
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Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.32528/hgn.v3i2.2914
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Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.32528/hgn.v2i2.1428
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Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.32528/ipteks.v2i1.559