Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.31284/j.jpp-iptek.2021.v5i2.1934
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.24198/mktt.v3i3.35251
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | Full PDF (936.837 KB) | DOI: 10.20961/lar.v20i2.56052
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.32938/jtast.v5i1.1282
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.32938/jtast.v5i1.3271
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.32585/bjas.v5i1.3375
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | Full PDF (437.979 KB) | DOI: 10.21157/j.ked.hewan.v12i3.10068
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.31604/jpm.v6i4.1171-1178
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.20884/1.jap.2023.25.2.214
Publisher :
Show Abstract | Download Original | Original Source | Check in Google Scholar | DOI: 10.32585/bjas.v4i2.2857